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    Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin

    • Item No : 135781158765
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $133.00

    • * Item Description

    • This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. Moreover, these topics had naturally evolved into the basis of the advanced course.
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