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ISBN-13: 9781468476088, 978-1468476088. Advances in X-Ray Analysis. Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961. Publisher: Springer-Verlag New York Inc., United States.
When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.