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Delay Fault Testing for VLSI Circuits by Angela Krstic (English) Hardcover Book
- Item No : 135773706402
- Condition : Brand New
- Brand : No brand Info
- Seller : the_nile
- Current Bid : US $190.12
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* Item Description
- By Angela Krstic, Kwang-Ting Cheng. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. This puts significant demands on timing analysis and delay testing.
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