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  • Delay Fault Testing for VLSI Circuits by Angela Krstic (English) Hardcover Book

    • Item No : 135773706402
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $190.12
    • * Item Description

    • By Angela Krstic, Kwang-Ting Cheng. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. This puts significant demands on timing analysis and delay testing.
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