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Electron Microscopy and Analysis, Paperback by Goodhew, P. J.; Humphreys, John; Beanland, Richard; Humphreys, F. J., ISBN 0748409688, ISBN-13 9780748409686, Like New Used, Free shipping in the US Three British professors introduce the principles behind both scanning and transmission electron microscopes, describing the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. The third edition adds outlines of confocal light microscopy and scanned probe microscopies. Annotation c. Book News, Inc., Portland, OR ()
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