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Principles of Materials Characterization and Metrology by Krishnan, Kannan M.
- Item No : 177187616355
- Condition : Brand New
- Brand : No brand Info
- Seller : loveourprices2
- Current Bid : US $59.32
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* Item Description
- Different spectroscopy, diffraction, and imaging techniques presented throughout. Based on forty years of teaching and research, this book incorporates worked examples, to test the. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that.
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