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    Scanning Electron Microscopy Physics of Image Formation and Microanalysis 2nd ED

    • Item No : 277218066558
    • Condition : Very Good
    • Brand : No brand Info
    • Seller : vjag4
    • Current Bid : US $99.99

    • * Item Description

    • The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channeling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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