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Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Paperb...
- Item No : 405833506493
- Condition : Like New
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- Seller : superbookdeals1
- Current Bid : US $99.35
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* Item Description
- Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Paperback by Goel, Sandeep K. (EDT); Chakrabarty, Krishnendu (EDT), ISBN 1138075779, ISBN-13 9781138075771, Like New Used, Free P&P in the UK
<p>Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. Th also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit. </p>
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